JUAL FOUR POINT PROBE OSSILA PRODUCT CODE T2001A4 DI BOGOR 081213268598

The Four Point Probe from Ossila (Product Code T2001A4) is designed for measuring the sheet resistance of thin films and materials with high accuracy. This setup typically consists of four equally spaced probes that make contact with the sample, allowing for precise measurements while minimizing the effects of contact resistance.

Key features often include:

• High Accuracy: Ideal for research and development in material science, particularly in semiconductors and conductive films.
• User-Friendly Interface: Often comes with software for data analysis and easy integration into existing experimental setups.
• Versatility: Suitable for a variety of materials including metals, semiconductors, and conductive polymers.

Specifications
Voltage Range ±100 μV to ±10 V. Current Range ±1 μA to ±200 mA (5 ranges). Sheet Resistance Range 100 mΩ/□ to 10 MΩ/□ (ohms per square)

Physical Specifications Probe Spacing 1.27 mm (0.05″). Rectangular Sample Size Range Long Edge Minimum: 5 mm (0.20″), Short Edge Maximum: 152.4 mm (6″). Circular Sample Size Range (Diameter) 5 mm to 152.4 mm (0.20″ to 6.00″). Maximum Sample Thickness 8 mm (0.31″). Overall Dimensions (W x H x D) 145 mm x 150 mm x 240 mm (5.71″ x 5.91″ x 9.45″).

Software Requirements Operating System Windows 10 or 11 (64-bit). CPU Dual Core 2 GHz. RAM 2 GB. Available Hard Drive Space 270 MB. Monitor Resolution 1440 x 900. Connectivity USB 2.0, or Ethernet (requires DHCP)

In the Box Ossila Four-Point Probe with head and stage. Integrated source measure unit. 60 x 60 mm glass substrate coated with 400 – 450 nm of FTO. Power adapter (24 VDC). USB-B cable

For more complete information, please contact the number 081213268598 and email Jip.Pratama@gmail.com